1. Neutron reflectometer is used for studying the characteristics such as thickness, surface roughness, interfacial roughness, composition and defect in thin films and layered media by measuring the reflected neutrons from surface. Specifically, it proves the neutron scattering density at depth of up to several hundred nanometer, with an effective depth resolution of a few nanometer. It is surface of various materials such as organic, inorganic, magnetics and polymer thin films. The instrument is under development at ST3 horizontal beam port in HANARO.  

3. Characteristics

- Reflection Plane : Vertical - Monochromator : PG(002), β =0.4o - Filter : PG,  =3.5o - Wavelength : 2.459Å - Measurement Q range: 0.003∼0.4 Å-1 - Minimum Reflectivity: 10-6 - Detector: 3He mono-detector